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Bruker Dimension ICON Atomic Force Microscope (AFM)

    Equipment/facility: Equipment

      Facility & Equipment Details

      Description

      Multimode available.
      Heating and Cooling from -35˚C to 250˚C.
      Scanner specifications: 90 µm X 90 µm in X-Y direction; 6 µm in Z direction.
      Sample size ≤ 200 mm (8 inch) in diameter and ≤ 15 mm (0.65 inch) in thickness.
      Applications: materials mapping, nanomechanics characterization, nanoelectrical characterization, biological characterization

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