Facility & Equipment Details
Description
The Zeiss Supra 55 VP is an ultra-high resolution Field Emission - Scanning Electron Microscope (FE-SEM) that operates in both high vacuum pressure and variable pressure modes, allowing flexibility to handle wide range of specimens.
System Capabilities:
Field Emission Cathode
Magnification: 12 - 900,000x
Electron Image Resolution:
1.0 nm (@ 15 kV)
1.7 nm (@ 1 kV)
3.5 nm (@ 0.2 kV)
2.0 nm (@ 30 kV in VP mode)
5-Axes (X,Y, Z, R, and T) Motorized Cartesian Sample Stage
Variable Pressure Range: 2 - 133 Pa, adjustable in steps of 1 Pa
Acceleration Voltage: 0.1 - 30 kV
Probe Current: 4 pA - 10 nA (20 nA optional)
Accessories:
EDS Detector (EDAX)
EBSD
System Capabilities:
Field Emission Cathode
Magnification: 12 - 900,000x
Electron Image Resolution:
1.0 nm (@ 15 kV)
1.7 nm (@ 1 kV)
3.5 nm (@ 0.2 kV)
2.0 nm (@ 30 kV in VP mode)
5-Axes (X,Y, Z, R, and T) Motorized Cartesian Sample Stage
Variable Pressure Range: 2 - 133 Pa, adjustable in steps of 1 Pa
Acceleration Voltage: 0.1 - 30 kV
Probe Current: 4 pA - 10 nA (20 nA optional)
Accessories:
EDS Detector (EDAX)
EBSD
Keywords
- Q Science (General)
- Microscope
- Microscopy
- Research
- Imaging
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