Skip to main navigation Skip to search Skip to main content

Ultra-High Resolution FE-SEM: Zeiss Supra 55 VP

    Equipment/facility: Equipment

      Facility & Equipment Details

      Description

      The Zeiss Supra 55 VP is an ultra-high resolution Field Emission - Scanning Electron Microscope (FE-SEM) that operates in both high vacuum pressure and variable pressure modes, allowing flexibility to handle wide range of specimens.

      System Capabilities:
      Field Emission Cathode
      Magnification: 12 - 900,000x
      Electron Image Resolution:
      1.0 nm (@ 15 kV)
      1.7 nm (@ 1 kV)
      3.5 nm (@ 0.2 kV)
      2.0 nm (@ 30 kV in VP mode)
      5-Axes (X,Y, Z, R, and T) Motorized Cartesian Sample Stage
      Variable Pressure Range: 2 - 133 Pa, adjustable in steps of 1 Pa
      Acceleration Voltage: 0.1 - 30 kV
      Probe Current: 4 pA - 10 nA (20 nA optional)

      Accessories:
      EDS Detector (EDAX)
      EBSD

      Keywords

      • Q Science (General)
      • Microscope
      • Microscopy
      • Research
      • Imaging

      Fingerprint

      Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.