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A 50 nm gate length InN tri-gate FET design with gm of 1.07 mS/μm and ft of 495 GHz

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Original languageEnglish
Title of host publication71st Device Research Conference, DRC 2013 - Conference Digest
Pages81-82
Number of pages2
DOIs
StatePublished - 2013
Event71st Device Research Conference, DRC 2013 - Notre Dame, IN, United States
Duration: Jun 23 2013Jun 26 2013

Publication series

NameDevice Research Conference - Conference Digest, DRC

Conference

Conference71st Device Research Conference, DRC 2013
Country/TerritoryUnited States
CityNotre Dame, IN
Period06/23/1306/26/13

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