Abstract
We describe a CMOS capacitance sensor for measuring the capacitive coupling between living cells and the underlying substrate, a quantity that can be used to characterize cell adhesion strength and cell health. The capacitance sensor operates on the charge sharing principle, mapping sensed capacitance values to voltages. The sensor has been fabricated in a commercially available 0.5 μm, 2-poly 3-metal CMOS technology. Experimental results are presented for bench tests using a micropositioned electrode and in vitro tests with cells cultured directly on the chip surface. The sensor achieves an empirical distance resolution of 3 nm and capacitance resolution of 135 aF. The sensors have been successfully used for long term monitoring of cell viability in vitro.
| Original language | English |
|---|---|
| Article number | 1465382 |
| Pages (from-to) | 3495-3498 |
| Number of pages | 4 |
| Journal | Proceedings - IEEE International Symposium on Circuits and Systems |
| DOIs | |
| State | Published - 2005 |
| Event | IEEE International Symposium on Circuits and Systems 2005, ISCAS 2005 - Kobe, Japan Duration: May 23 2005 → May 26 2005 |
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