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A CMOS capacitance sensor for cell adhesion characterization

  • Somashekar Bangalore Prakash
  • , Pamela Abshire
  • , Mario Urdaneta
  • , Elisabeth Smela
  • University of Maryland, College Park

Research output: Contribution to journalConference articlepeer-review

24 Scopus citations

Abstract

We describe a CMOS capacitance sensor for measuring the capacitive coupling between living cells and the underlying substrate, a quantity that can be used to characterize cell adhesion strength and cell health. The capacitance sensor operates on the charge sharing principle, mapping sensed capacitance values to voltages. The sensor has been fabricated in a commercially available 0.5 μm, 2-poly 3-metal CMOS technology. Experimental results are presented for bench tests using a micropositioned electrode and in vitro tests with cells cultured directly on the chip surface. The sensor achieves an empirical distance resolution of 3 nm and capacitance resolution of 135 aF. The sensors have been successfully used for long term monitoring of cell viability in vitro.

Original languageEnglish
Article number1465382
Pages (from-to)3495-3498
Number of pages4
JournalProceedings - IEEE International Symposium on Circuits and Systems
DOIs
StatePublished - 2005
EventIEEE International Symposium on Circuits and Systems 2005, ISCAS 2005 - Kobe, Japan
Duration: May 23 2005May 26 2005

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