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A comparison study of TIM degradation of phase change material and thermal grease

  • Junbo Yang
  • , Yangyang Lai
  • , Ke Pan
  • , Jiefeng Xu
  • , Travis Mikjaniec
  • , Stephen Cain
  • , Seungbae Park
  • State University of New York Binghamton University
  • Juniper Networks

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

27 Scopus citations

Abstract

All electronic packages will induce excess heat during usage and heat dissipation methods were developed to remove spare heat from the die in order to improve reliability. Thermal interface materials (TIMs) are one of the key solutions to decrease the thermal resistance between the power device and heat sink. There are a wide variety of TIM material types in electronic packages. Thermal grease is a thermally conductive chemical with high thermal conductivity and commonly used for high-power packages. Phase change materials (PCMs) which are epoxy-based polymer with some thermally conductive fillers will soften with heat and change state from solid to semi-solid and semi-liquid. Compare to thermal grease, PCMs are easy to assemble and no need to dry-out and reduced the voids, pump-out, or delamination. In this study, PCMs and thermal grease during thermal cycling and power cycling were studied. For power cycling, heaters were built inside the die and corresponding thermal sensors were designed to spread all over the die to monitor the thermal resistance changes which reflect temperature changes through the cycling. Wind speed and loading pressure were set as working conditions. According to the resistance of each heater, adjust current to keep total power a constant. After cycling, TIM material behaviors were analyzed. The performance of PCMs and thermal grease under thermal cycling and power cycling and the effect of the degradation of these TIMs are studied and discussed. Based on experiment results, PCMs has better performance in thermal cycle test but thermal grease is more stable than PCMs in power cycle test.

Original languageEnglish
Title of host publicationProceedings - IEEE 71st Electronic Components and Technology Conference, ECTC 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1978-1983
Number of pages6
ISBN (Electronic)9780738145235
DOIs
StatePublished - 2021
Event71st IEEE Electronic Components and Technology Conference, ECTC 2021 - Virtual, Online, United States
Duration: Jun 1 2021Jul 4 2021

Publication series

NameProceedings - Electronic Components and Technology Conference
Volume2021-June

Conference

Conference71st IEEE Electronic Components and Technology Conference, ECTC 2021
Country/TerritoryUnited States
CityVirtual, Online
Period06/1/2107/4/21

Keywords

  • Power cycling
  • Thermal cycling
  • Thermal degradation
  • Thermal interface material (TIM)

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