TY - GEN
T1 - A high-resolution side-channel attack on last-level cache
AU - Kayaalp, Mehmet
AU - Abu-Ghazaleh, Nael
AU - Ponomarev, Dmitry
AU - Jaleel, Aamer
N1 - Publisher Copyright: © 2016 ACM.
PY - 2016/6/5
Y1 - 2016/6/5
N2 - Recently demonstrated side-channel attacks on shared Last Level Caches (LLCs) work under a number of constraints on both the system and the victim behavior that limit their applicability. This paper demonstrates on a real system a new high-resolution LLC side channel attack that relaxes some of these assumptions. Specifically, we introduce and exploit new techniques to achieve high-resolution tracking of the victim accesses to enable attacks on ciphers where critical events have a small cache footprint. We compare the quality of the side-channel in our attack to that obtained using Flush+ Reload attacks, which are significantly more precise but work only when the sensitive data is shared between the attacker and the victim. We show that our attack frequently obtains an equal quality channel, which we also confirmed by reconstructing the victim cryptographic key.
AB - Recently demonstrated side-channel attacks on shared Last Level Caches (LLCs) work under a number of constraints on both the system and the victim behavior that limit their applicability. This paper demonstrates on a real system a new high-resolution LLC side channel attack that relaxes some of these assumptions. Specifically, we introduce and exploit new techniques to achieve high-resolution tracking of the victim accesses to enable attacks on ciphers where critical events have a small cache footprint. We compare the quality of the side-channel in our attack to that obtained using Flush+ Reload attacks, which are significantly more precise but work only when the sensitive data is shared between the attacker and the victim. We show that our attack frequently obtains an equal quality channel, which we also confirmed by reconstructing the victim cryptographic key.
UR - https://www.scopus.com/pages/publications/84977090978
U2 - 10.1145/2897937.2897962
DO - 10.1145/2897937.2897962
M3 - Conference contribution
T3 - Proceedings - Design Automation Conference
BT - Proceedings of the 53rd Annual Design Automation Conference, DAC 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 53rd Annual ACM IEEE Design Automation Conference, DAC 2016
Y2 - 5 June 2016 through 9 June 2016
ER -