TY - GEN
T1 - A low-swing differential signaling scheme for on-chip global interconnects
AU - Narasimhan, Ashok
AU - Kasotiya, Manish
AU - Sridhar, Ramalingam
PY - 2005
Y1 - 2005
N2 - The dense Very Deep Submicron (VDSM) System on Chips (SoC) face a serious limitation in performance due to reverse scaling of global interconnects. Interconnection techniques which decrease delay, delay variation and ensure signal integrity, play an important role in the growth of the semiconductor industry into future generations. Current-mode low-swing interconnection techniques provide an attractive alternative to conventional full-swing voltage mode signaling in terms of delay, power and noise immunity. In this paper, we present a new current-mode low-swing interconnection technique which reduces the delay and delay variations in global interconnects. Extensive simulations for performance of our circuit under crosstalk, supply voltage, process and temperature variations were performed. The results indicate significant savings in power, reduction in delay and increase in noise immunity compared to other techniques.
AB - The dense Very Deep Submicron (VDSM) System on Chips (SoC) face a serious limitation in performance due to reverse scaling of global interconnects. Interconnection techniques which decrease delay, delay variation and ensure signal integrity, play an important role in the growth of the semiconductor industry into future generations. Current-mode low-swing interconnection techniques provide an attractive alternative to conventional full-swing voltage mode signaling in terms of delay, power and noise immunity. In this paper, we present a new current-mode low-swing interconnection technique which reduces the delay and delay variations in global interconnects. Extensive simulations for performance of our circuit under crosstalk, supply voltage, process and temperature variations were performed. The results indicate significant savings in power, reduction in delay and increase in noise immunity compared to other techniques.
UR - https://www.scopus.com/pages/publications/27944449657
U2 - 10.1109/ICVD.2005.19
DO - 10.1109/ICVD.2005.19
M3 - Conference contribution
SN - 0769522645
T3 - Proceedings of the IEEE International Conference on VLSI Design
SP - 634
EP - 639
BT - Proceedings of the 18th International Conference on VLSI Design
T2 - 18th International Conference on VLSI Design: Power Aware Design of VLSI Systems
Y2 - 3 January 2005 through 7 January 2005
ER -