Abstract
In this paper we extend the wordlength pattern and minimum aberration for non-regular factorials. The new concepts, the generalized wordlength pattern and minimum generalized aberration, are proposed. Some connections between the generalized wordlength pattern and uniformity are given. Some applications of the new concepts in the Blackett and Burman's designs are discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 85-93 |
| Number of pages | 9 |
| Journal | Metrika |
| Volume | 53 |
| Issue number | 1 |
| DOIs | |
| State | Published - 2001 |
Keywords
- Code theory
- Discrepancy
- Generalized wordlength pattern
- Minimum aberration
- Orthogonal fractional factorial designs
- Uniform design
- Uniformity
- Wordlength pattern
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