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A robust stamp detection framework on degraded documents

  • University of Maryland, College Park

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

20 Scopus citations

Abstract

Detecting documents with a certain stamp instance is an effective and reliable way to retrieve documents associated with a specific source. However, this unique problem has essentially remained unaddressed. In this paper, we present a novel stamp detection framework based on parameter estimation of connected edge features. Using robust basic-shape detectors, the approach is effective for stamps with analytically shaped contours, when only limited samples are available. For elliptic/circular stamps, it efficiently exploits the orientation information from pairs of edge points to determine its center position and area, without computing all the five parameters of an ellipse. In our approach, we considered the set of unique characteristics of stamp patterns. Specifically, we introduced effective algorithms to address the problem that stamps often spatially overlay their background contents. These give our approach significant advantages in detection accuracy and computation complexity over traditional Hough transform method in locating candidate ellipse regions. Experimental results on real degraded documents demonstrated the robustness of this retrieval approach on large document database, which consists of both printed text and handwritten notes.

Original languageEnglish
Title of host publicationDocument Recognition and Retrieval XIII - Proceedings of SPIE-IS and T Electronic Imaging
DOIs
StatePublished - 2006
EventDocument Recognition and Retrieval XIII - San Jose, CA, United States
Duration: Jan 18 2006Jan 19 2006

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6067

Conference

ConferenceDocument Recognition and Retrieval XIII
Country/TerritoryUnited States
CitySan Jose, CA
Period01/18/0601/19/06

Keywords

  • Document analysis
  • Ellipse detection
  • Hough transform
  • Pattern retrieval
  • Stamp/seal detection

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