A two-stage gas amplification secondary electron detector for ultra-high resolution imaging

B. L. Thiel; M. Toth; R. P.M. Schroemges; J. J. Scholtz; G. Van Veen; W. R. Knowles

doi:10.1017/S1431927604884654

A two-stage gas amplification secondary electron detector for ultra-high resolution imaging

B. L. Thiel
, M. Toth
, R. P.M. Schroemges
, J. J. Scholtz
, G. Van Veen
, W. R. Knowles

College of Nanotechnology, Science & Engineering (CNSE), Dean's Office

University at Albany

Thermo Fisher Scientific, Inc.

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Original language	English
Pages (from-to)	1058-1059
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	10
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927604884654
State	Published - 2004

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title = "A two-stage gas amplification secondary electron detector for ultra-high resolution imaging",

author = "Thiel, \{B. L.\} and M. Toth and Schroemges, \{R. P.M.\} and Scholtz, \{J. J.\} and \{Van Veen\}, G. and Knowles, \{W. R.\}",

year = "2004",

doi = "10.1017/S1431927604884654",

language = "English",

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pages = "1058--1059",

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T1 - A two-stage gas amplification secondary electron detector for ultra-high resolution imaging

AU - Thiel, B. L.

AU - Toth, M.

AU - Schroemges, R. P.M.

AU - Scholtz, J. J.

AU - Van Veen, G.

AU - Knowles, W. R.

PY - 2004

Y1 - 2004

UR - https://www.scopus.com/pages/publications/4544293185

U2 - 10.1017/S1431927604884654

DO - 10.1017/S1431927604884654

M3 - Article

SN - 1431-9276

VL - 10

SP - 1058

EP - 1059

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

A two-stage gas amplification secondary electron detector for ultra-high resolution imaging

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