@inproceedings{389e3f06959c4878a481a65174847486,
title = "Adaptive test scheduling in SoC's by dynamic partitioning",
abstract = "In this paper, we present a novel adaptive scheduling algorithm for testing embedded core-based SoC's. Tests are scheduled in a way that dynamically partitions and allocates the tests, consequently constructing and updating a set of dynamically partitioned power constrained concurrent test sets, and ultimately reducing the test application time. A simulation study shows the productivity gained by our new approach.",
keywords = "Adaptive scheduling, Circuit testing, Costs, Dynamic scheduling, Energy consumption, Fault detection, Job shop scheduling, Parallel processing, Processor scheduling, System testing",
author = "Dan Zhao and S. Upadhyaya",
note = "Publisher Copyright: {\textcopyright} 2002 IEEE.; 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2002 ; Conference date: 06-11-2002 Through 08-11-2002",
year = "2002",
doi = "10.1109/DFTVS.2002.1173530",
language = "English",
series = "Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "334--342",
booktitle = "Proceediings - 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2002",
address = "United States",
}