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Adaptive Test-Time Semantic Debiasing for AI-Generated Image Detection

  • Yu Cai
  • , Jiahe Tian
  • , Xiaomeng Fu
  • , Jiao Dai
  • , Jizhong Han
  • , Siwei Lyu
  • SUNY Buffalo
  • CAS - Institute of Information Engineering

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

AI-generated image detectors have historically concentrated on generalization across generative models, often overlooking the critical challenge of cross-semantic generalizability. This limitation constrains the adaptability of detectors to new semantic content in real-world settings. We propose Adaptive Test-Time Semantic Debiasing (ATTSD), a zero-shot approach that utilizes the visual-semantic space of large pretrained vision-language models to dynamically align feature representations during testing-without requiring additional training data or annotations. To further enhance adaptability, we introduce Semantic-Suppression for hard sample mining, adjusting the degree of semantic debiasing for each sample based on Fourier transform properties. To assess cross-semantic generalizability, we present the Cross-Semantic AI-generated Image Detection dataset (CSAIID), a benchmark comprising diverse semantic categories reflective of real-world complexities. Extensive experiments show that ATTSD achieves state-of-the-art performance, particularly excelling in cross-semantic scenarios, positioning it as a promising solution for detecting evolving AI-generated content. The CSAIID dataset is pub-licly available here.

Original languageEnglish
Title of host publicationProceedings - 2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1554-1563
Number of pages10
ISBN (Electronic)9798331589882
DOIs
StatePublished - 2025
Event2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025 - Honolulu, United States
Duration: Oct 19 2025Oct 20 2025

Publication series

NameProceedings - 2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025

Conference

Conference2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025
Country/TerritoryUnited States
CityHonolulu
Period10/19/2510/20/25

Keywords

  • AIGC Security
  • Deepfake Detection
  • Media Forensics

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