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Adversarial Evasion Attacks on OCC-Based Machine Learning Intrusion Detection Systems in the Internet of Things

  • David Lykke Sorensen
  • , Mohamed Baza
  • , Mahmoud M. Badr
  • , Tara Salman
  • , Amar Rasheed
  • College of Charleston
  • Texas Tech University
  • Sam Houston State University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The rapid expansion of Internet of Things (IoT) technologies has transformed interactions between physical and digital systems, driving advancements in smart cities, healthcare, and industrial automation. However, the distributed nature of IoT devices and the vast volumes of data they generate make them prime targets for cyber threats. Intrusion Detection Systems (IDS), enhanced by machine learning, are vital for identifying and mitigating these threats. This paper examines evasion attacks within a one-class classification (OCC) framework, a machine learning technique for anomaly detection, focusing on adversarial attacks like the Fast Gradient Sign Method (FGSM) and Projected Gradient Descent (PGD). The study specifically explores vulnerabilities in OCC models, including autoencoders and support vector machines (SVM), within IoT systems. Experimental results reveal a significant drop in model performance due to adversarial perturbations, highlighting the need for more robust defenses in OCC-based IDS for IoT security.

Original languageEnglish
Title of host publication2025 IEEE 1st Secure and Trustworthy Cyberinfrastructure for IoT and Microelectronics, SATC 2025 - Conference Proceedings
EditorsFathi Amsaad, Ahmed Abdelgawad, Alaa Ali Hameed, Akhtar Jamil
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798331514204
DOIs
StatePublished - 2025
Event1st IEEE Secure and Trustworthy Cyberinfrastructure for IoT and Microelectronics, SATC 2025 - Dayton, United States
Duration: Feb 25 2025Feb 27 2025

Publication series

Name2025 IEEE 1st Secure and Trustworthy Cyberinfrastructure for IoT and Microelectronics, SATC 2025 - Conference Proceedings

Conference

Conference1st IEEE Secure and Trustworthy Cyberinfrastructure for IoT and Microelectronics, SATC 2025
Country/TerritoryUnited States
CityDayton
Period02/25/2502/27/25

Keywords

  • Assessment
  • Auto Encoder
  • Intrusion Detection
  • Machine learning
  • OCC models
  • SVM
  • Security

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