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Adversarial Examples Detection Using No-Reference Image Quality Features

  • Institut national de la recherche scientifique

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

13 Scopus citations

Abstract

Recently, it has been discovered that Deep Neural Networks (DNNs) are highly vulnerable to deliberate perturbations, which, when added to the input sample, can mislead the DNNs based systems. The corresponding samples with deliberate perturbations are called adversarial examples (AEs). The challenge of AEs is very critical in security and safety systems, which if fooled or misled can yield serious consequences. Therefore, it is essential to devise methods to enhance the robustness of DNNs against adversarial attacks. Quintessential mechanism is adversarial examples detection. An adversarial attack detection method aims at disambiguating clean samples from AEs. More recently, few techniques have been proposed in the literature, nonetheless majority of them are very complex or not able to attain low enough error rates. In this paper, we present a novel technique to improve the security of DNNs by detecting different types of AEs. The proposed framework presents a very low degree of complexity and utilizes ten nonintrusive image quality features to distinguish between legitimate and adversarial attack samples. Experimental analysis on the standard MNIST and CIFAR10 datasets shows promising results not only for different adversarial examples generation methods but also various additive perturbations.

Original languageEnglish
Title of host publication52nd Annual 2018 IEEE International Carnahan Conference on Security Technology, ICCST 2018 - Proceedings
EditorsBrian G. Rich
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538679319
DOIs
StatePublished - Dec 21 2018
Event52nd Annual IEEE International Carnahan Conference on Security Technology, ICCST 2018 - Montreal, Canada
Duration: Oct 22 2018Oct 25 2018

Publication series

NameProceedings - International Carnahan Conference on Security Technology
Volume2018-October

Conference

Conference52nd Annual IEEE International Carnahan Conference on Security Technology, ICCST 2018
Country/TerritoryCanada
CityMontreal
Period10/22/1810/25/18

Keywords

  • Adversarial Attacks
  • Adversarial Examples
  • Deep Learning
  • Deep Neural Networks
  • Pattern Classification

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