Abstract
The importance of frequency response considerations in the use of thin-film gauges for unsteady heat transfer measurements in transient facilities is considered, and methods for evaluating it are proposed. A departure frequency response function is introduced and illustrated by an existing analog circuit. A Fresnel integral temperature which possesses the essential features of the film temperature in transient facilities is introduced and is used to evaluate two numerical algorithms. Finally, criteria are proposed for the use of finite-difference algorithms for the calculation of the unsteady heat flux from a sampled temperature signal.
| Original language | English |
|---|---|
| Pages (from-to) | 333-342 |
| Number of pages | 10 |
| Journal | Experimental Thermal and Fluid Science |
| Volume | 4 |
| Issue number | 3 |
| DOIs | |
| State | Published - May 1991 |
Keywords
- heat flux measurement
- thin-film gauge
- transient environments
- unsteady heat transfer
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