TY - GEN
T1 - An investigation of Au-Ag interface formed by cold welding using focused ion beam/transmission electron microscopy
AU - Cao, Yifang
AU - Yao, Nan
AU - McIlwrath, Kevin
AU - Zhou, Jikou
AU - Osinkolu, Gabriel
AU - Soboyejo, Winston O.
PY - 2006
Y1 - 2006
N2 - This paper reports the recent results of a transmission electron microscopy study of cold-welded and e-beam deposited Au-Ag interfaces. Dust particles were observed to be embedded between the cold-welded interfaces. These are shown to amplify the defect regions caused by surface asperities. Electron energy loss spectroscopy (EELS) analysis revealed that there was no significant diffusion zone across the cold welding interface. However, sub-micron mechanical twining structures were revealed by transmission electron microscopy (TEM) analyses. These were found to penetrate through both the cold-welded and control Au-Ag interfaces, but with different orientations.
AB - This paper reports the recent results of a transmission electron microscopy study of cold-welded and e-beam deposited Au-Ag interfaces. Dust particles were observed to be embedded between the cold-welded interfaces. These are shown to amplify the defect regions caused by surface asperities. Electron energy loss spectroscopy (EELS) analysis revealed that there was no significant diffusion zone across the cold welding interface. However, sub-micron mechanical twining structures were revealed by transmission electron microscopy (TEM) analyses. These were found to penetrate through both the cold-welded and control Au-Ag interfaces, but with different orientations.
UR - https://www.scopus.com/pages/publications/40949144480
U2 - 10.1557/proc-0965-s12-06
DO - 10.1557/proc-0965-s12-06
M3 - Conference contribution
SN - 9781604234176
T3 - Materials Research Society Symposium Proceedings
SP - 13
EP - 18
BT - Organic Electronics
PB - Materials Research Society
T2 - 2006 MRS Fall Meeting
Y2 - 27 November 2006 through 1 December 2006
ER -