Abstract
Drastically different morphological anisotropy was induced by linear photopolymerization in thin amorphous films of poly(vinyl 4-methoxy-cinnamate) (PVMC) and Langmuir-Blodgett films of 12-8(poly)diacetylene (PDA) deposited on glass substrates. Examination of these films by x-ray reflectivity reveals that the PVMC films became rough while PDA thin films became smooth along the direction of polarization of uv light. The elongated x-ray coherence area inherent to the reflectivity technique allowed quantitative determination of changes in the film morphology and structure.
| Original language | English |
|---|---|
| Pages (from-to) | 3777-3781 |
| Number of pages | 5 |
| Journal | Physical Review E |
| Volume | 53 |
| Issue number | 4 |
| DOIs | |
| State | Published - 1996 |
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