Skip to main navigation Skip to search Skip to main content

Assembly and reliability issues associated with leadless chip scale packages

  • State University of New York Binghamton University
  • Universal Instruments Corporation

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations

Abstract

This paper addresses the assembly and reliability of 0.5 mm pitch leadless Chip Scale Packages (CSP) on .062″ immersion Ag plated printed circuit boards (PCB) using Pb-free solder paste. Four different leadless CSP designs were studied and each was evaluated using multiple PCB attachment pad designs. Assembly was performed by stencil printing solder paste over the PCB pads, placing components with a high-speed placement machine, and reflowing in a forced convection oven. Vision issues were encountered during the placement process and a "video model" was required to place certain leadless packages. Post assembly characterization included electrical measurements, visual inspection, X-ray inspection, and representative cross-sectioning to examine the 2 nd level solder interconnects. Assemblies were subjected to 20-minute 0-100°C air-to-air thermal cycles. Cycle to failure (CTF) data was found to be quite sensitive to optimization of the solder paste printing process and, possibly, to the board pad dimensions.

Original languageEnglish
Pages (from-to)900-905
Number of pages6
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5288
StatePublished - 2003
Event2003 International Symposium on Microelectronics - Boston, MA, United States
Duration: Nov 18 2003Nov 20 2003

Fingerprint

Dive into the research topics of 'Assembly and reliability issues associated with leadless chip scale packages'. Together they form a unique fingerprint.

Cite this