Atomic force microscopy contact mode study on Ultra high molecular weight polyethylene

This paper presents the results of contact mode atomic force microscopy (AFM) study on the nanoscale Young's modulus and work of adhesion of ultra high molecular weight polyethylene (UHMWPE). Cryoultramicrotomed surfaces of UHMWPE were scanned using the contact mode of AFM. Fibril regions are commonly found on the sample, however, a non-fibril paniculate region was also found. AFM force displacement curves were obtained for the sample. The JKR theory and Maugis Dugdale model were used for the analysis. A good fitting between the theories and experimental data was found. The nanoscale Young's modulus and work of adhesion of UHMWPE extracted from the experimental data were in reasonably good agreement with the values reported in other literatures.