Atomic resolution study of local strains in doped VO2 nanowires

Hasti Asayesh-Ardakani; Anmin Nie; Peter M. Marley; Sujay Singh; Patrick J. Philips; Farzad Mashayek; Ganapathy Sambandamurthy; Ke Bin Low; Robert F. Klie; Sarbajit Banerjee; Gregory M. Odegard; Reza Shahbazian-Yassar

doi:10.1017/S1431927614007090

Atomic resolution study of local strains in doped VO₂ nanowires

Hasti Asayesh-Ardakani
, Anmin Nie
, Peter M. Marley
, Sujay Singh
, Patrick J. Philips
, Farzad Mashayek
, Ganapathy Sambandamurthy
, Ke Bin Low
, Robert F. Klie
, Sarbajit Banerjee
, Gregory M. Odegard
, Reza Shahbazian-Yassar

Physics

University at Buffalo

Michigan Technological University
University of Illinois at Chicago
SUNY Buffalo

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	1074-1075
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614007090
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

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10.1017/S1431927614007090

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@article{df6aac8ac1fb46f784a6f51c4cd4d88a,

title = "Atomic resolution study of local strains in doped VO2 nanowires",

author = "Hasti Asayesh-Ardakani and Anmin Nie and Marley, \{Peter M.\} and Sujay Singh and Philips, \{Patrick J.\} and Farzad Mashayek and Ganapathy Sambandamurthy and Low, \{Ke Bin\} and Klie, \{Robert F.\} and Sarbajit Banerjee and Odegard, \{Gregory M.\} and Reza Shahbazian-Yassar",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614007090",

language = "English",

volume = "20",

pages = "1074--1075",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "3",

note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

}

TY - JOUR

T1 - Atomic resolution study of local strains in doped VO2 nanowires

AU - Asayesh-Ardakani, Hasti

AU - Nie, Anmin

AU - Marley, Peter M.

AU - Singh, Sujay

AU - Philips, Patrick J.

AU - Mashayek, Farzad

AU - Sambandamurthy, Ganapathy

AU - Low, Ke Bin

AU - Klie, Robert F.

AU - Banerjee, Sarbajit

AU - Odegard, Gregory M.

AU - Shahbazian-Yassar, Reza

PY - 2014/8/1

Y1 - 2014/8/1

UR - https://www.scopus.com/pages/publications/84927916834

U2 - 10.1017/S1431927614007090

DO - 10.1017/S1431927614007090

M3 - Conference article

SN - 1431-9276

VL - 20

SP - 1074

EP - 1075

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Atomic resolution study of local strains in doped VO₂ nanowires

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