Abstract
Achieving robust electrical contacts is crucial for realizing the promise of monolayer 2D semiconductors such as semiconducting transition metal dichalcogenides (s-TMDs) in electronics. Despite recent breakthroughs, a gap remains between the experimental and theoretical understanding of metal-s-TMDs contacts. This study explores bismuth semimetal contacts to monolayer MoSe2, using a platform that minimizes experimental sources of uncertainty; we combine contact-front and contact-end measurements to measure key parameters like specific resistivity (ρc) and transfer length (Lt). We find that the resistivity of MoSe2 under the contacts is enhanced due to charge transfer that can be modeled using a self-consistent approach. In contrast, ab initio calculations of the interlayer charge transfer rate are inconsistent with the measured value of ρc, highlighting the need for new theoretical approaches.
| Original language | English |
|---|---|
| Pages (from-to) | 11217-11223 |
| Number of pages | 7 |
| Journal | Nano Letters |
| Volume | 24 |
| Issue number | 36 |
| DOIs | |
| State | Published - Sep 11 2024 |
Keywords
- contact
- defect
- model
- transition metal dichalcogenides
- ultraclean
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