Abstract
Environmental transmission electron microscopy probes the local structure, composition, and chemistry of materials under gas environments, while ambient-pressure X-ray photoelectron spectroscopy provides ensemble chemical and electronic structure information in gaseous conditions. Both techniques utilize similar differential pumping schemes to mitigate electron scattering by the gas phase, allowing for unique opportunities to correlate gas-surface interactions across comparable pressure ranges. Their integration has advanced the understanding of various catalytic reactions, including the water-gas-shift reaction, CO oxidation, and surface passivation dynamics. This Mini-Review discusses their methodological advancements, challenges, and potential for further integration with other in situ techniques to address complex catalytic phenomena and guide catalyst design.
| Original language | English |
|---|---|
| Pages (from-to) | 6570-6584 |
| Number of pages | 15 |
| Journal | Journal of Physical Chemistry Letters |
| Volume | 16 |
| Issue number | 25 |
| DOIs | |
| State | Published - Jun 26 2025 |
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