Bulk and surface characterization of a dewetting thin film polymer bilayer

H. Ade; D. A. Winesett; A. P. Smith; S. Anders; T. Stammler; C. Heske; D. Slep; M. H. Rafailovich; J. Sokolov; J. Stöhr

doi:10.1063/1.122891

Bulk and surface characterization of a dewetting thin film polymer bilayer

H. Ade
, D. A. Winesett
, A. P. Smith
, S. Anders
, T. Stammler
, C. Heske
, D. Slep
, M. H. Rafailovich
, J. Sokolov
, J. Stöhr

Materials Science and Engineering

Stony Brook University

Research output: Contribution to journal › Article › peer-review

47 Scopus citations

Abstract

We have monitored the progression of the dewetting of a partially brominated polystyrene (PBrS) thin film on top of a polystyrene (PS) thin film with scanning transmission x-ray microscopy (STXM) as well as photoemission electron microscopy (PEEM). We mapped the projected thickness of each constituent polymer species and the total thickness of the film with STXM, while we determined the surface composition with PEEM. Our data show that the PBrS top layer becomes encapsulated during the later stages of dewetting and that atomic force microscopy topographs cannot be utilized to determine the contact angle between PBrS and PS.

Original language	English
Pages (from-to)	3775-3777
Number of pages	3
Journal	Applied Physics Letters
Volume	73
Issue number	25
DOIs	https://doi.org/10.1063/1.122891
State	Published - 1998

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title = "Bulk and surface characterization of a dewetting thin film polymer bilayer",

abstract = "We have monitored the progression of the dewetting of a partially brominated polystyrene (PBrS) thin film on top of a polystyrene (PS) thin film with scanning transmission x-ray microscopy (STXM) as well as photoemission electron microscopy (PEEM). We mapped the projected thickness of each constituent polymer species and the total thickness of the film with STXM, while we determined the surface composition with PEEM. Our data show that the PBrS top layer becomes encapsulated during the later stages of dewetting and that atomic force microscopy topographs cannot be utilized to determine the contact angle between PBrS and PS.",

author = "H. Ade and Winesett, \{D. A.\} and Smith, \{A. P.\} and S. Anders and T. Stammler and C. Heske and D. Slep and Rafailovich, \{M. H.\} and J. Sokolov and J. St{\"o}hr",

year = "1998",

doi = "10.1063/1.122891",

language = "English",

volume = "73",

pages = "3775--3777",

journal = "Applied Physics Letters",

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TY - JOUR

T1 - Bulk and surface characterization of a dewetting thin film polymer bilayer

AU - Ade, H.

AU - Winesett, D. A.

AU - Smith, A. P.

AU - Anders, S.

AU - Stammler, T.

AU - Heske, C.

AU - Slep, D.

AU - Rafailovich, M. H.

AU - Sokolov, J.

AU - Stöhr, J.

PY - 1998

Y1 - 1998

N2 - We have monitored the progression of the dewetting of a partially brominated polystyrene (PBrS) thin film on top of a polystyrene (PS) thin film with scanning transmission x-ray microscopy (STXM) as well as photoemission electron microscopy (PEEM). We mapped the projected thickness of each constituent polymer species and the total thickness of the film with STXM, while we determined the surface composition with PEEM. Our data show that the PBrS top layer becomes encapsulated during the later stages of dewetting and that atomic force microscopy topographs cannot be utilized to determine the contact angle between PBrS and PS.

AB - We have monitored the progression of the dewetting of a partially brominated polystyrene (PBrS) thin film on top of a polystyrene (PS) thin film with scanning transmission x-ray microscopy (STXM) as well as photoemission electron microscopy (PEEM). We mapped the projected thickness of each constituent polymer species and the total thickness of the film with STXM, while we determined the surface composition with PEEM. Our data show that the PBrS top layer becomes encapsulated during the later stages of dewetting and that atomic force microscopy topographs cannot be utilized to determine the contact angle between PBrS and PS.

UR - https://www.scopus.com/pages/publications/0000606040

U2 - 10.1063/1.122891

DO - 10.1063/1.122891

M3 - Article

SN - 0003-6951

VL - 73

SP - 3775

EP - 3777

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 25

ER -

Bulk and surface characterization of a dewetting thin film polymer bilayer

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