Characterization of the three-dimensional structure of paper using x-ray microtomography

Amit Goel; Manolis Tzanakakis; Shuiyuan Huang; Shri Ramaswamy; Doeung Choi; Bandaru V. Ramarao

Characterization of the three-dimensional structure of paper using x-ray microtomography

Amit Goel
, Manolis Tzanakakis
, Shuiyuan Huang
, Shri Ramaswamy
, Doeung Choi
, Bandaru V. Ramarao

Chemical Engineering

College of Environmental Science & Forestry

University of Minnesota Twin Cities
Research Center

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

X-ray microtomography was used to obtain three-dimensional bulk images of commercial liquid packaging board samples in a non-destructive manner. Porosity and specific surface area of the samples were then calculated using image analysis. Porosity values obtained by image analysis were compared with the values obtained by caliper-basis weight measurement and mercury intrusion porosimetry. Interestingly the x-ray images indicate that even though the pores follow a highly tortuous path they all seem to be inter-connected.

Original language	English
Title of host publication	TAPPI Engineering Conference
Pages	695-759
Number of pages	65
State	Published - 2000
Event	Proceedings of the 2000 TAPPI Engineering Conference - Atlanta, GA, United States Duration: Sep 17 2000 → Sep 21 2000

Publication series

Name	TAPPI Engineering Conference

Conference

Conference	Proceedings of the 2000 TAPPI Engineering Conference
Country/Territory	United States
City	Atlanta, GA
Period	09/17/00 → 09/21/00

Cite this

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title = "Characterization of the three-dimensional structure of paper using x-ray microtomography",

abstract = "X-ray microtomography was used to obtain three-dimensional bulk images of commercial liquid packaging board samples in a non-destructive manner. Porosity and specific surface area of the samples were then calculated using image analysis. Porosity values obtained by image analysis were compared with the values obtained by caliper-basis weight measurement and mercury intrusion porosimetry. Interestingly the x-ray images indicate that even though the pores follow a highly tortuous path they all seem to be inter-connected.",

author = "Amit Goel and Manolis Tzanakakis and Shuiyuan Huang and Shri Ramaswamy and Doeung Choi and Ramarao, \{Bandaru V.\}",

year = "2000",

language = "English",

isbn = "0898529719",

series = "TAPPI Engineering Conference",

pages = "695--759",

booktitle = "TAPPI Engineering Conference",

note = "Proceedings of the 2000 TAPPI Engineering Conference ; Conference date: 17-09-2000 Through 21-09-2000",

}

TY - GEN

T1 - Characterization of the three-dimensional structure of paper using x-ray microtomography

AU - Goel, Amit

AU - Tzanakakis, Manolis

AU - Huang, Shuiyuan

AU - Ramaswamy, Shri

AU - Choi, Doeung

AU - Ramarao, Bandaru V.

PY - 2000

Y1 - 2000

N2 - X-ray microtomography was used to obtain three-dimensional bulk images of commercial liquid packaging board samples in a non-destructive manner. Porosity and specific surface area of the samples were then calculated using image analysis. Porosity values obtained by image analysis were compared with the values obtained by caliper-basis weight measurement and mercury intrusion porosimetry. Interestingly the x-ray images indicate that even though the pores follow a highly tortuous path they all seem to be inter-connected.

AB - X-ray microtomography was used to obtain three-dimensional bulk images of commercial liquid packaging board samples in a non-destructive manner. Porosity and specific surface area of the samples were then calculated using image analysis. Porosity values obtained by image analysis were compared with the values obtained by caliper-basis weight measurement and mercury intrusion porosimetry. Interestingly the x-ray images indicate that even though the pores follow a highly tortuous path they all seem to be inter-connected.

UR - https://www.scopus.com/pages/publications/0142187726

M3 - Conference contribution

SN - 0898529719

T3 - TAPPI Engineering Conference

SP - 695

EP - 759

BT - TAPPI Engineering Conference

T2 - Proceedings of the 2000 TAPPI Engineering Conference

Y2 - 17 September 2000 through 21 September 2000

ER -

Characterization of the three-dimensional structure of paper using x-ray microtomography

Abstract

Publication series

Conference

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