Abstract
Presently, R&D organizations of leading semiconductor companies are focusing their efforts on developing devices, technologies, and applications for below the 100 nanometer feature size. Specific device, circuit, and system challenges for the 30 nanometer feature size in present R&D focus at Motorola, are analyzed in this paper. Circuit solutions that will ease the device and technology development while allowing the stringent device, circuit, and system performance requirements for the 30 nanometer node to be met, are proposed.
| Original language | English |
|---|---|
| Pages (from-to) | 325-329 |
| Number of pages | 5 |
| Journal | Proceedings of the Annual IEEE International ASIC Conference and Exhibit |
| DOIs | |
| State | Published - 2001 |
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