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Comparison of raised source/drain versus raised extension in ultra-thin body, fully-depleted-SOI, including effects of BEOL via capacitances

  • J. L. Egley
  • , Anne Vandooren
  • , Brian Winstead
  • , Eric Verret
  • , Chip Workman
  • , Bruce White
  • , Bich Yen Nguyen

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

Raised source/drain (S/D) or raised extension in fully-depleted-SOI (FDSOI) is necessary to boost saturation current, because of increased resistance from the very thin film. We demonstrate that the choice of raising the extension versus the S/D, will depend upon the maximum achievable mobility in the structure at a 60 nm physical gate length. We also study the effects of minimum BEOL via spacing on performance, and its consequence on choosing a raised extension or S/D.

Original languageEnglish
Pages (from-to)1607-1612
Number of pages6
JournalSolid-State Electronics
Volume48
Issue number9
DOIs
StatePublished - Sep 2004

Keywords

  • FDSOI
  • Fully depleted SOI
  • Raised S/D
  • Raised SD extension

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