Abstract
While it is known that the Si-(7×7) is a conducting surface, measured conductivity values differ by 7 orders of magnitude. Here we report a combined STM and transport method capable of surface conductivity measurement of step-free or single-step containing surface regions and having minimal interaction with the sample, and by which we quantitatively determine the intrinsic conductivity of the Si-(7×7) surface. We found that a single step has a conductivity per unit length about 50 times smaller than the flat surface. Our first principles quantum transport calculations confirm and lend insight into the experimental observation.
| Original language | English |
|---|---|
| Article number | 246802 |
| Journal | Physical Review Letters |
| Volume | 112 |
| Issue number | 24 |
| DOIs | |
| State | Published - Jun 18 2014 |
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