Abstract
We have studied crystal structure and associated defects in GaN/α-Al2O3 (0001) films grown under nitrogen-deficient conditions by metalorganic chemical vapor deposition and pulsed laser deposition. N-deficient films exhibit polycrystalline structure with a mixture of cubic zinc-blende and wurtzite hexagonal GaN grains retaining tetragonal bonding across the boundaries and hence the epitaxial orientations and polarity. Renucleation of the wurtzite phase at different {111} planes of cubic GaN results in a rough and faceted surface of the film. We elucidate that the cubic phase is more stable under the nitrogen deficiency.
| Original language | English |
|---|---|
| Pages (from-to) | 2465-2467 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 74 |
| Issue number | 17 |
| DOIs | |
| State | Published - Apr 26 1999 |
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