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Dependence of Sn grain morphology of Sn-Ag-Cu solder on solidification temperature

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103 Scopus citations

Abstract

Near-eutectic Sn-Ag-Cu samples were produced in different sizes and geometries, with different solidification temperatures. The Sn grain morphologies of samples were characterized and found to be correlated with the sample solidification temperature; the lower the solidification temperature, the higher the degree of interlacing observed. These Sn grain morphologies were observed to be consistent with a simple model that envisions the nucleus in an undercooled Sn-Ag-Cu liquid to be Sn atoms clustered around a Ag atom in a hexagonal configuration that allows Sn to grow epitaxially on each of its surfaces. At intermediate degrees of undercooling, a mixed Sn grain morphology is observed, with the interlaced portion associated with the region closer to Sn nucleation in these samples.

Original languageEnglish
Pages (from-to)362-374
Number of pages13
JournalJournal of Electronic Materials
Volume41
Issue number2
DOIs
StatePublished - Feb 2012

Keywords

  • Pb-free solder
  • electron backscattered diffraction (EBSD)
  • growth
  • microstructure
  • nucleation
  • solidification temperature

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