Abstract
Near-eutectic Sn-Ag-Cu samples were produced in different sizes and geometries, with different solidification temperatures. The Sn grain morphologies of samples were characterized and found to be correlated with the sample solidification temperature; the lower the solidification temperature, the higher the degree of interlacing observed. These Sn grain morphologies were observed to be consistent with a simple model that envisions the nucleus in an undercooled Sn-Ag-Cu liquid to be Sn atoms clustered around a Ag atom in a hexagonal configuration that allows Sn to grow epitaxially on each of its surfaces. At intermediate degrees of undercooling, a mixed Sn grain morphology is observed, with the interlaced portion associated with the region closer to Sn nucleation in these samples.
| Original language | English |
|---|---|
| Pages (from-to) | 362-374 |
| Number of pages | 13 |
| Journal | Journal of Electronic Materials |
| Volume | 41 |
| Issue number | 2 |
| DOIs | |
| State | Published - Feb 2012 |
Keywords
- Pb-free solder
- electron backscattered diffraction (EBSD)
- growth
- microstructure
- nucleation
- solidification temperature
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