Abstract
The transient off-state transport in amorphous silicon thin-film transistors was modeled by deriving an analytic solution. A diffusion equation with a generation term to account for the emission from deep states formed the basis of the solution. Results indicated that for times greater than the diffusion time, the transport current was proportional to the generation rate from approximately uniform density of states in the band gap.
| Original language | English |
|---|---|
| Pages (from-to) | 1302-1304 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 82 |
| Issue number | 8 |
| DOIs | |
| State | Published - Feb 24 2003 |
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