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Diffusion-limited transport in the off-state of amorphous Si thin-film transistors

  • General Electric

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

The transient off-state transport in amorphous silicon thin-film transistors was modeled by deriving an analytic solution. A diffusion equation with a generation term to account for the emission from deep states formed the basis of the solution. Results indicated that for times greater than the diffusion time, the transport current was proportional to the generation rate from approximately uniform density of states in the band gap.

Original languageEnglish
Pages (from-to)1302-1304
Number of pages3
JournalApplied Physics Letters
Volume82
Issue number8
DOIs
StatePublished - Feb 24 2003

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