TY - GEN
T1 - DRAM-Locker
T2 - 2024 Design, Automation and Test in Europe Conference and Exhibition, DATE 2024
AU - Zhou, Ranyang
AU - Ahmed, Sabbir
AU - Roohi, Arman
AU - Rakin, Adnan Siraj
AU - Angizi, Shaahin
N1 - Publisher Copyright: © 2024 EDAA.
PY - 2024
Y1 - 2024
N2 - In this work, we propose DRAM-Locker as a robust general-purpose defense mechanism that can protect DRAM against various adversarial Deep Neural Network (DNN) weight attacks affecting data or page tables. DRAM-Locker harnesses the capabilities of in-DRAM swapping combined with a lock-table to prevent attackers from singling out specific DRAM rows to safeguard DNN's weight parameters. Our results indicate that DRAM-Locker can deliver a high level of protection downgrading the performance of targeted weight attacks to a random attack level. Furthermore, the proposed defense mechanism demonstrates no reduction in accuracy when applied to CIFAR-I0 and CIFAR-100. Importantly, DRAM-Locker does not necessitate any software retraining or result in extra hardware burden.
AB - In this work, we propose DRAM-Locker as a robust general-purpose defense mechanism that can protect DRAM against various adversarial Deep Neural Network (DNN) weight attacks affecting data or page tables. DRAM-Locker harnesses the capabilities of in-DRAM swapping combined with a lock-table to prevent attackers from singling out specific DRAM rows to safeguard DNN's weight parameters. Our results indicate that DRAM-Locker can deliver a high level of protection downgrading the performance of targeted weight attacks to a random attack level. Furthermore, the proposed defense mechanism demonstrates no reduction in accuracy when applied to CIFAR-I0 and CIFAR-100. Importantly, DRAM-Locker does not necessitate any software retraining or result in extra hardware burden.
UR - https://www.scopus.com/pages/publications/85210067901
U2 - 10.23919/date58400.2024.10546892
DO - 10.23919/date58400.2024.10546892
M3 - Conference contribution
T3 - Proceedings -Design, Automation and Test in Europe, DATE
BT - 2024 Design, Automation and Test in Europe Conference and Exhibition, DATE 2024 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 25 March 2024 through 27 March 2024
ER -