Effect of doping on crystalline quality of rubidium titanyl phosphate (RTP) crystals grown by the TSSG method

Jianqiu Guo; Balaji Raghothamachar; Michael Dudley; Joan J. Carvajal; Ali Butt; Maria Cinta Pujol; Rosam M. Sole; Jaume Massons; Magdalena Aguilo; Francesc Diaz

doi:10.1557/opl.2014.899

Effect of doping on crystalline quality of rubidium titanyl phosphate (RTP) crystals grown by the TSSG method

Jianqiu Guo
, Balaji Raghothamachar
, Michael Dudley
, Joan J. Carvajal
, Ali Butt
, Maria Cinta Pujol
, Rosam M. Sole
, Jaume Massons
, Magdalena Aguilo
, Francesc Diaz

Materials Science and Engineering

Stony Brook University

Research output: Contribution to journal › Conference article › peer-review

2 Scopus citations

Abstract

Defect structures in Rubidium Titanyl Phosphate (RTP) crystals (non-doped and doped) grown by the Top Seeded Solution Growth (TSSG) method were characterized using Synchrotron White Beam X-ray Topography. Main defects observed in non-doped crystals are growth sector boundaries while both growth sector boundaries and growth striations are observed in the Nb single doped and (Nb,Yb)-codoped crystals with relatively few linear defects such as dislocations. Results show that the overall crystalline quality is lowered as more doping elements are incorporated. Details of defect distributions are correlated with the growth process to facilitate high quality growth of doped RTP.

Original language	English
Journal	Materials Research Society Symposium - Proceedings
Volume	1698
DOIs	https://doi.org/10.1557/opl.2014.899
State	Published - 2014
Event	2014 MRS Spring Meeting - San Francisco, United States Duration: Apr 21 2014 → Apr 25 2014

Keywords

crystal growth
defects
x-ray diffraction (XRD)

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10.1557/opl.2014.899

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title = "Effect of doping on crystalline quality of rubidium titanyl phosphate (RTP) crystals grown by the TSSG method",

abstract = "Defect structures in Rubidium Titanyl Phosphate (RTP) crystals (non-doped and doped) grown by the Top Seeded Solution Growth (TSSG) method were characterized using Synchrotron White Beam X-ray Topography. Main defects observed in non-doped crystals are growth sector boundaries while both growth sector boundaries and growth striations are observed in the Nb single doped and (Nb,Yb)-codoped crystals with relatively few linear defects such as dislocations. Results show that the overall crystalline quality is lowered as more doping elements are incorporated. Details of defect distributions are correlated with the growth process to facilitate high quality growth of doped RTP.",

keywords = "crystal growth, defects, x-ray diffraction (XRD)",

author = "Jianqiu Guo and Balaji Raghothamachar and Michael Dudley and Carvajal, \{Joan J.\} and Ali Butt and Pujol, \{Maria Cinta\} and Sole, \{Rosam M.\} and Jaume Massons and Magdalena Aguilo and Francesc Diaz",

note = "Publisher Copyright: Copyright {\textcopyright} 2014 Materials Research Society.; 2014 MRS Spring Meeting ; Conference date: 21-04-2014 Through 25-04-2014",

year = "2014",

doi = "10.1557/opl.2014.899",

language = "English",

volume = "1698",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

}

TY - JOUR

T1 - Effect of doping on crystalline quality of rubidium titanyl phosphate (RTP) crystals grown by the TSSG method

AU - Guo, Jianqiu

AU - Raghothamachar, Balaji

AU - Dudley, Michael

AU - Carvajal, Joan J.

AU - Butt, Ali

AU - Pujol, Maria Cinta

AU - Sole, Rosam M.

AU - Massons, Jaume

AU - Aguilo, Magdalena

AU - Diaz, Francesc

PY - 2014

Y1 - 2014

N2 - Defect structures in Rubidium Titanyl Phosphate (RTP) crystals (non-doped and doped) grown by the Top Seeded Solution Growth (TSSG) method were characterized using Synchrotron White Beam X-ray Topography. Main defects observed in non-doped crystals are growth sector boundaries while both growth sector boundaries and growth striations are observed in the Nb single doped and (Nb,Yb)-codoped crystals with relatively few linear defects such as dislocations. Results show that the overall crystalline quality is lowered as more doping elements are incorporated. Details of defect distributions are correlated with the growth process to facilitate high quality growth of doped RTP.

AB - Defect structures in Rubidium Titanyl Phosphate (RTP) crystals (non-doped and doped) grown by the Top Seeded Solution Growth (TSSG) method were characterized using Synchrotron White Beam X-ray Topography. Main defects observed in non-doped crystals are growth sector boundaries while both growth sector boundaries and growth striations are observed in the Nb single doped and (Nb,Yb)-codoped crystals with relatively few linear defects such as dislocations. Results show that the overall crystalline quality is lowered as more doping elements are incorporated. Details of defect distributions are correlated with the growth process to facilitate high quality growth of doped RTP.

KW - crystal growth

KW - defects

KW - x-ray diffraction (XRD)

UR - https://www.scopus.com/pages/publications/84924390305

U2 - 10.1557/opl.2014.899

DO - 10.1557/opl.2014.899

M3 - Conference article

SN - 0272-9172

VL - 1698

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - 2014 MRS Spring Meeting

Y2 - 21 April 2014 through 25 April 2014

ER -

Effect of doping on crystalline quality of rubidium titanyl phosphate (RTP) crystals grown by the TSSG method

Abstract

Keywords

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