Abstract
A general computational approach to determine the effect of solder joint shape on the fatigue life is presented. Using the integrated matrix creep failure metric, a number of cases are considered wherein the solder volume, standoff height, or both, are varied and the joint life computed. Both volumetric and interface averaging of the matrix creep are considered. For non-mask defined pads, the greater the solder volume, the higher the life; for mask defined pads, the reverse trend was observed.
| Original language | English |
|---|---|
| Pages | 187-191 |
| Number of pages | 5 |
| State | Published - 1996 |
| Event | Proceedings of the 1996 5th Intersociety Conference on Thermal Phenomena in Electronic Systems - Orlando, FL, USA Duration: May 29 1996 → Jun 1 1996 |
Conference
| Conference | Proceedings of the 1996 5th Intersociety Conference on Thermal Phenomena in Electronic Systems |
|---|---|
| City | Orlando, FL, USA |
| Period | 05/29/96 → 06/1/96 |
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