Effects of dopant granularity on superhalo-channel MOSFET's according to two- And three-dimensional computer simulations

We have performed two-dimensional (2-D) and three-dimensional (3-D) computer simulations of random dopant fluctuations in 25-nm planar n-channel metal-oxide-semiconductor field effect transistor (MOSFET) with superhalo channel doping. Our study shows that 2-D simulations that neglect lateral percolation of the carriers can overestimate the impact on threshold voltage (V_T) fluctuations by as much as a factor of four. Fundamental differences in the way the 2-D and 3-D models describe subthreshold and near-threshold conduction are highlighted in our study. Our models reveal that surface percolation of carriers is an effective agent for reducing V_T fluctuations. In addition, the halo only enhances the V_T fluctuations by approximately 10%. Though the influence of the superhalo in the device may be overwhelmed by atomistic granularity according to the 2-D model, 3-D simulations show that the halo continues to function coherently for the MOSFET ensemble when charge percolation is accounted.