Experimental extraction and model evaluation of base and collector current RF noise in SiGe HBTs

Guofu Niu; Kejun Xia; David Sheridan; David L. Harame

Experimental extraction and model evaluation of base and collector current RF noise in SiGe HBTs

Guofu Niu
, Kejun Xia
, David Sheridan
, David L. Harame

NY Creates Research Foundation

NY Creates

Auburn University
Global Foundries, Inc.

Research output: Contribution to conference › Paper › peer-review

11 Scopus citations

Abstract

This work presents experimental extraction of intrinsic base and collector current noise of SiGe HBTs as well as their correlation. Using the extraction results, several widely used noise models are evaluated, including the conventional SPICE model, the Van Yliet model, and the transport noise model. Connections and differences between various models are discussed.

Original language	English
Pages	615-618
Number of pages	4
State	Published - 2004
Event	Digest of Papers - 2004 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Fort Worth, TX, United States Duration: Jun 6 2004 → Jun 8 2004

Conference

Conference	Digest of Papers - 2004 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium
Country/Territory	United States
City	Fort Worth, TX
Period	06/6/04 → 06/8/04

Cite this

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title = "Experimental extraction and model evaluation of base and collector current RF noise in SiGe HBTs",

abstract = "This work presents experimental extraction of intrinsic base and collector current noise of SiGe HBTs as well as their correlation. Using the extraction results, several widely used noise models are evaluated, including the conventional SPICE model, the Van Yliet model, and the transport noise model. Connections and differences between various models are discussed.",

author = "Guofu Niu and Kejun Xia and David Sheridan and Harame, \{David L.\}",

year = "2004",

language = "English",

pages = "615--618",

note = "Digest of Papers - 2004 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium ; Conference date: 06-06-2004 Through 08-06-2004",

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TY - CONF

T1 - Experimental extraction and model evaluation of base and collector current RF noise in SiGe HBTs

AU - Niu, Guofu

AU - Xia, Kejun

AU - Sheridan, David

AU - Harame, David L.

PY - 2004

Y1 - 2004

N2 - This work presents experimental extraction of intrinsic base and collector current noise of SiGe HBTs as well as their correlation. Using the extraction results, several widely used noise models are evaluated, including the conventional SPICE model, the Van Yliet model, and the transport noise model. Connections and differences between various models are discussed.

AB - This work presents experimental extraction of intrinsic base and collector current noise of SiGe HBTs as well as their correlation. Using the extraction results, several widely used noise models are evaluated, including the conventional SPICE model, the Van Yliet model, and the transport noise model. Connections and differences between various models are discussed.

UR - https://www.scopus.com/pages/publications/4444275391

M3 - Paper

SP - 615

EP - 618

T2 - Digest of Papers - 2004 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium

Y2 - 6 June 2004 through 8 June 2004

ER -

Experimental extraction and model evaluation of base and collector current RF noise in SiGe HBTs

Abstract

Conference

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