Focused beam total reflection X-ray fluorescence with low power sources coupled to doubly curved crystal optics

Z. W. Chen; N. Mail; F. Z. Wei; C. A. MacDonald; W. M. Gibson

doi:10.1016/j.sab.2005.02.015

Focused beam total reflection X-ray fluorescence with low power sources coupled to doubly curved crystal optics

Z. W. Chen
, N. Mail
, F. Z. Wei
, C. A. MacDonald
, W. M. Gibson

Physics

University at Albany

Research output: Contribution to journal › Article › peer-review

19 Scopus citations

Abstract

A focused beam total X-ray fluorescence technique was developed based on doubly curved crystal optics. This technique provides good detection sensitivity and spatial resolution for localized detection of surface deposits. Compact low power X-ray sources were used to demonstrate the benefit of the X-ray optics for focusing Cr Kα, Cu Kα and Mo Kα radiation. The detection capability of the focused beam Total reflection X-ray fluorescence system was investigated with dried droplets of calibrated low concentration solutions. Detection limits at the femtogram level were demonstrated.

Original language	English
Pages (from-to)	471-478
Number of pages	8
Journal	Spectrochimica Acta - Part B Atomic Spectroscopy
Volume	60
Issue number	4
DOIs	https://doi.org/10.1016/j.sab.2005.02.015
State	Published - Apr 30 2005

Keywords

Compact X-ray sources
Detection limit
Doubly curved crystal optics
Total reflection X-ray fluorescence

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10.1016/j.sab.2005.02.015

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title = "Focused beam total reflection X-ray fluorescence with low power sources coupled to doubly curved crystal optics",

abstract = "A focused beam total X-ray fluorescence technique was developed based on doubly curved crystal optics. This technique provides good detection sensitivity and spatial resolution for localized detection of surface deposits. Compact low power X-ray sources were used to demonstrate the benefit of the X-ray optics for focusing Cr Kα, Cu Kα and Mo Kα radiation. The detection capability of the focused beam Total reflection X-ray fluorescence system was investigated with dried droplets of calibrated low concentration solutions. Detection limits at the femtogram level were demonstrated.",

keywords = "Compact X-ray sources, Detection limit, Doubly curved crystal optics, Total reflection X-ray fluorescence",

author = "Chen, \{Z. W.\} and N. Mail and Wei, \{F. Z.\} and MacDonald, \{C. A.\} and Gibson, \{W. M.\}",

year = "2005",

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doi = "10.1016/j.sab.2005.02.015",

language = "English",

volume = "60",

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journal = "Spectrochimica Acta - Part B Atomic Spectroscopy",

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TY - JOUR

T1 - Focused beam total reflection X-ray fluorescence with low power sources coupled to doubly curved crystal optics

AU - Chen, Z. W.

AU - Mail, N.

AU - Wei, F. Z.

AU - MacDonald, C. A.

AU - Gibson, W. M.

PY - 2005/4/30

Y1 - 2005/4/30

N2 - A focused beam total X-ray fluorescence technique was developed based on doubly curved crystal optics. This technique provides good detection sensitivity and spatial resolution for localized detection of surface deposits. Compact low power X-ray sources were used to demonstrate the benefit of the X-ray optics for focusing Cr Kα, Cu Kα and Mo Kα radiation. The detection capability of the focused beam Total reflection X-ray fluorescence system was investigated with dried droplets of calibrated low concentration solutions. Detection limits at the femtogram level were demonstrated.

AB - A focused beam total X-ray fluorescence technique was developed based on doubly curved crystal optics. This technique provides good detection sensitivity and spatial resolution for localized detection of surface deposits. Compact low power X-ray sources were used to demonstrate the benefit of the X-ray optics for focusing Cr Kα, Cu Kα and Mo Kα radiation. The detection capability of the focused beam Total reflection X-ray fluorescence system was investigated with dried droplets of calibrated low concentration solutions. Detection limits at the femtogram level were demonstrated.

KW - Compact X-ray sources

KW - Detection limit

KW - Doubly curved crystal optics

KW - Total reflection X-ray fluorescence

UR - https://www.scopus.com/pages/publications/19944384952

U2 - 10.1016/j.sab.2005.02.015

DO - 10.1016/j.sab.2005.02.015

M3 - Article

SN - 0584-8547

VL - 60

SP - 471

EP - 478

JO - Spectrochimica Acta - Part B Atomic Spectroscopy

JF - Spectrochimica Acta - Part B Atomic Spectroscopy

IS - 4

ER -

Focused beam total reflection X-ray fluorescence with low power sources coupled to doubly curved crystal optics

Abstract

Keywords

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