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Frequency-domain measurement of spontaneous emission lifetime in rare-earth-doped gain media

  • Emir Salih Magden
  • , Patrick T. Callahan
  • , Nanxi Li
  • , Katia Shtyrkova
  • , Alfonso Ruocco
  • , Neetesh Singh
  • , Ming Xin
  • , Diedrik Vermeulen
  • , Jonathan D.B. Bradley
  • , Gerald Leake
  • , Douglas D. Coolbaugh
  • , Leslie A. Kolodziejski
  • , Franz X. Kärtner
  • , Erich P. Ippen
  • , Michael R. Watts
  • Massachusetts Institute of Technology
  • Harvard University
  • McMaster University
  • SUNY Albany
  • German Electron Synchrotron

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The spontaneous emission lifetime in Al2O3:Tm3+ waveguides is measured to be 568 ± 48 s, using a frequency-domain method. The method is studied and verified in Er3+-doped silica fiber, yielding a measured lifetime of 9.73 ± 0.08 ms.

Original languageEnglish
Title of host publication2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-2
Number of pages2
ISBN (Electronic)9781943580279
StatePublished - Oct 25 2017
Event2017 Conference on Lasers and Electro-Optics, CLEO 2017 - San Jose, United States
Duration: May 14 2017May 19 2017

Publication series

Name2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings
Volume2017-January

Conference

Conference2017 Conference on Lasers and Electro-Optics, CLEO 2017
Country/TerritoryUnited States
CitySan Jose
Period05/14/1705/19/17

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