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Fully-automated emission spectroscopic set-up for non-LTE and gas mixture plasma studies

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Abstract

A fast, accurate and comprehensive emission spectroscopic set-up, suitable for non-LTE and gas mixture plasma studies has been developed to overcome the drawbacks in conventional systems. The side-on intensity of a spectral line, its neighboring continuum and the intensity distribution of a spectral band of about 110 A are recorded simultaneously in less than 10 seconds; similar raster scan of the arc can be completed in less than 100 seconds. XY electro-optical scanning of the discharge, scanning of the spectrograph's spectral range, wavelength selection on the spectrometers and the spectrum's intensity-range setting can be pre-programmed for fast and convenient data acquisition.

Original languageEnglish
Title of host publicationHeat Transfer in Thermal Plasma Processing
PublisherPubl by ASME
Pages89-93
Number of pages5
ISBN (Print)0791807304
StatePublished - 1991
Event28th National Heat Transfer Conference - Minneapolis, MN, USA
Duration: Jul 28 1991Jul 31 1991

Publication series

NameAmerican Society of Mechanical Engineers, Heat Transfer Division, (Publication) HTD
Volume161

Conference

Conference28th National Heat Transfer Conference
CityMinneapolis, MN, USA
Period07/28/9107/31/91

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