Generation of spurious x-rays by focused ion beams in dual beam instruments

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4 Scopus citations

Original language	English
Pages (from-to)	1250-1251
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606068000
State	Published - Aug 2006

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@article{b0b642350b0047eb946530add1356572,

title = "Generation of spurious x-rays by focused ion beams in dual beam instruments",

author = "Evertsen, \{J. J.\} and M. Toth and Thiel, \{B. L.\} and E. Lifshin",

year = "2006",

month = aug,

doi = "10.1017/S1431927606068000",

language = "English",

volume = "12",

pages = "1250--1251",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Generation of spurious x-rays by focused ion beams in dual beam instruments

AU - Evertsen, J. J.

AU - Toth, M.

AU - Thiel, B. L.

AU - Lifshin, E.

PY - 2006/8

Y1 - 2006/8

UR - https://www.scopus.com/pages/publications/33750876274

U2 - 10.1017/S1431927606068000

DO - 10.1017/S1431927606068000

M3 - Article

SN - 1431-9276

VL - 12

SP - 1250

EP - 1251

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -