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Growth and selection of intermetallic species in Sn-Ag-Cu No-Pb solder systems based on pad metallurgies and thermal histories

  • L. P. Lehman
  • , R. K. Kinyanjui
  • , L. Zavalij
  • , A. Zribi
  • , E. J. Cotts
  • State University of New York Binghamton University

Research output: Contribution to journalConference articlepeer-review

18 Scopus citations

Abstract

The adoption of Pb-free solders will affect manufacturing processes and joint reliability for electronics packages. Since SAC solder has a higher melting temperature than eutectic Pb-Sn solder, higher processing temperatures will be required. The higher processing temperatures allow for increased solubility of some elements, such as Ni, within the solder melt. The specific selection of pad metallurgies can influence both the type of intermetallics that form at the pad interfaces, and the age related evolution of those intermetallics. In joints where both Ni and Cu pad metallurgies are present, the fast diffusing Cu species can allow the intermetallic compound, (Cu,Ni)6Sn5 to form at the opposite, Ni, interface. The absence of a Cu pad can starve the system of Cu and effectively stop the growth of this (Cu,Ni)6Sn5 intermetallic compound. The Ag component of the SAC solder can, under proper conditions, result in the growth of Ag3Sn plates in the solder melt before the Sn phase nucleates. This is controlled by the specific concentration of Ag in the solder, by the cooling rate of the solder, and by the tendency of the solder joints to undercool by a typical 30°C before the Sn phase nucleates. The critical cooling rate for the onset of this phenomenon is between 3°C/sec. and 0.3°C/sec., within the range of normal reflow practices of the electronics industry.

Original languageEnglish
Pages (from-to)1215-1221
Number of pages7
JournalProceedings - Electronic Components and Technology Conference
StatePublished - 2003
Event53rd Electronic Components and Technology Conference 2003 - New Orleans LA, United States
Duration: May 27 2003May 30 2003

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