High intensity scanning microscopy with a femtosecond Cr:forsterite laser

Chi Kuang Sun; Shi Wei Chu; Tzu Ming Liu; Ping Chin Cheng

High intensity scanning microscopy with a femtosecond Cr:forsterite laser

Chi Kuang Sun
, Shi Wei Chu
, Tzu Ming Liu
, Ping Chin Cheng

Department of Electrical Engineering

University at Buffalo

National Taiwan University

Research output: Contribution to journal › Conference article › peer-review

3 Scopus citations

Abstract

A high-intensity microscopy technique that uses a femtosecond Cr:forsterite laser source with a center wavelength of 1220-1240nm is introduced. Advantages of using this laser technique include, that its two-photon fluorescence/second-harmonic-generation (SHG) falls in the red region and its three-photon fluorescence/third-harmonic-generation (THG) falls in the blue-to-green regions, which are visible and can be easily separated from the infrared pump-wavelength.

Original language	English
Pages (from-to)	95-96
Number of pages	2
Journal	Scanning
Volume	22
Issue number	2
State	Published - Mar 2000
Event	SCANNING 2000 - San Antonio, TX, USA Duration: May 9 2000 → May 12 2000

Cite this

@article{f290de48553847b38b7c868ef8fcd0c1,

title = "High intensity scanning microscopy with a femtosecond Cr:forsterite laser",

abstract = "A high-intensity microscopy technique that uses a femtosecond Cr:forsterite laser source with a center wavelength of 1220-1240nm is introduced. Advantages of using this laser technique include, that its two-photon fluorescence/second-harmonic-generation (SHG) falls in the red region and its three-photon fluorescence/third-harmonic-generation (THG) falls in the blue-to-green regions, which are visible and can be easily separated from the infrared pump-wavelength.",

author = "Sun, \{Chi Kuang\} and Chu, \{Shi Wei\} and Liu, \{Tzu Ming\} and Cheng, \{Ping Chin\}",

year = "2000",

month = mar,

language = "English",

volume = "22",

pages = "95--96",

journal = "Scanning",

issn = "0161-0457",

publisher = "John Wiley and Sons Inc.",

number = "2",

note = "SCANNING 2000 ; Conference date: 09-05-2000 Through 12-05-2000",

}

TY - JOUR

T1 - High intensity scanning microscopy with a femtosecond Cr:forsterite laser

AU - Sun, Chi Kuang

AU - Chu, Shi Wei

AU - Liu, Tzu Ming

AU - Cheng, Ping Chin

PY - 2000/3

Y1 - 2000/3

N2 - A high-intensity microscopy technique that uses a femtosecond Cr:forsterite laser source with a center wavelength of 1220-1240nm is introduced. Advantages of using this laser technique include, that its two-photon fluorescence/second-harmonic-generation (SHG) falls in the red region and its three-photon fluorescence/third-harmonic-generation (THG) falls in the blue-to-green regions, which are visible and can be easily separated from the infrared pump-wavelength.

AB - A high-intensity microscopy technique that uses a femtosecond Cr:forsterite laser source with a center wavelength of 1220-1240nm is introduced. Advantages of using this laser technique include, that its two-photon fluorescence/second-harmonic-generation (SHG) falls in the red region and its three-photon fluorescence/third-harmonic-generation (THG) falls in the blue-to-green regions, which are visible and can be easily separated from the infrared pump-wavelength.

UR - https://www.scopus.com/pages/publications/0034156105

M3 - Conference article

SN - 0161-0457

VL - 22

SP - 95

EP - 96

JO - Scanning

JF - Scanning

IS - 2

T2 - SCANNING 2000

Y2 - 9 May 2000 through 12 May 2000

ER -

High intensity scanning microscopy with a femtosecond Cr:forsterite laser

Abstract

Other files and links

Fingerprint

Cite this