Abstract
The high-resolution imaging of magnetization dynamics in magnetic nanostructures was discussed. The combination of time resolved magnetic-transmission x-ray microscopy (MTXM), time resolved Kerr microscopy and micromagnetic simulations were used for the imaging of the magnetic particles. The precisional response of a micron sized magnetic element when subjected to short magnetic field pulse with unprecedented spatial resolution was also discussed. It was observed that the high lateral resolution of the MTXM allowed an analysis of behaviors in the domain walls.
| Original language | English |
|---|---|
| Pages (from-to) | 3328-3330 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 84 |
| Issue number | 17 |
| DOIs | |
| State | Published - Apr 26 2004 |
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