@inproceedings{60abccc65ab348ff8026c7b35be82bc8,
title = "High spatial resolution X-ray spectroscopy with the XM-1 X-ray microscope",
abstract = "The XM-1 x-ray microscope was built to obtain high-resolution transmission images from a wide variety of thick (< 10 micron) samples. Modeled after a {"}conventional{"} full-field microscope, XM-1 makes use of zone plates (ZP) for the condenser and objective elements. The XM-1 x-ray microscope has been shown to have a spatial resolution of 36nm by doing a 10\%-90\% edge scan across a knife edge. Moreover, the condenser ZP and pinhole combination yields good spectral resolution to A/AA, of 700. We have shown that with this energy resolution we can distinguish between different elements and some chemical states. We can see spectra with adequate signal to noise even for individual 36nm pixels. With these capabilities, we are beginning work on various experiments in which we will distinguish different chemical species of specific elements within a sample.",
author = "Johnson, \{Lewis E.\} and Greg Denbeaux and Werner Meyer-Ilse",
note = "Publisher Copyright: {\textcopyright} 2000 American Institute of Physics Inc.. All rights reserved.; 11th US National Conference on Synchrotron Radiation Instrumentation, SRI 1999 ; Conference date: 13-10-1999 Through 15-10-1999",
year = "2000",
month = jun,
day = "6",
doi = "10.1063/1.1291755",
language = "English",
series = "AIP Conference Proceedings",
publisher = "American Institute of Physics Inc.",
pages = "35--38",
editor = "Piero Pianetta and John Arthur and Sean Brennan",
booktitle = "Synchrotron Radiation Instrumentation, SRI 1999 - 11th US National Conference",
}