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Holographic microinterferometric technique for measurements of laser diode cavity deformations

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Holographic interferometric technique for measurement of laser diode crystal thermoelastic deformations is presented. Using this technique allows us to estimate thermoelastic stresses in laser crystal, active layer temperature and dynamics of heat transfer from laser crystal to heatsink.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsMichael R. Descour, Kevin G. Harding, Donald J. Svetkoff
Pages250-259
Number of pages10
StatePublished - 1996
EventThree-Dimensional and Unconventional Imaging for Industrial Inspection and Metrology - Philadelphia, PA, USA
Duration: Oct 23 1995Oct 25 1995

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2599

Conference

ConferenceThree-Dimensional and Unconventional Imaging for Industrial Inspection and Metrology
CityPhiladelphia, PA, USA
Period10/23/9510/25/95

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