Identification of Dominant Noise Source and Parameter Sensitivity for Substrate Coupling

Emre Salman; Eby G. Friedman; Radu M. Secareanu; Olin L. Hartin

doi:10.1109/TVLSI.2008.2005195

Identification of Dominant Noise Source and Parameter Sensitivity for Substrate Coupling

Emre Salman
, Eby G. Friedman
, Radu M. Secareanu
, Olin L. Hartin

Electrical Engineering

Stony Brook University

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

A simple, yet physically intuitive macrolevel model is presented to identify the dominant substrate coupling mechanism at the early stages of the design process, while simultaneously considering multiple parameters. Furthermore, the sensitivity of substrate noise to these parameters is evaluated, demonstrating the nonmonotonic dependence of noise on rise time. The design implications of the proposed analysis are discussed, identifying the preferred noise reduction technique for a specific set of operating points.

Original language	English
Article number	4799227
Pages (from-to)	1559-1564
Number of pages	6
Journal	IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume	17
Issue number	10
DOIs	https://doi.org/10.1109/TVLSI.2008.2005195
State	Published - Oct 2009

Keywords

Dominant substrate noise source
Mixed-signal circuits
Substrate noise coupling

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10.1109/TVLSI.2008.2005195

Cite this

@article{5e7eaf3bfd7b4b85ad7c5749c45ccedb,

title = "Identification of Dominant Noise Source and Parameter Sensitivity for Substrate Coupling",

abstract = "A simple, yet physically intuitive macrolevel model is presented to identify the dominant substrate coupling mechanism at the early stages of the design process, while simultaneously considering multiple parameters. Furthermore, the sensitivity of substrate noise to these parameters is evaluated, demonstrating the nonmonotonic dependence of noise on rise time. The design implications of the proposed analysis are discussed, identifying the preferred noise reduction technique for a specific set of operating points.",

keywords = "Dominant substrate noise source, Mixed-signal circuits, Substrate noise coupling",

author = "Emre Salman and Friedman, \{Eby G.\} and Secareanu, \{Radu M.\} and Hartin, \{Olin L.\}",

year = "2009",

month = oct,

doi = "10.1109/TVLSI.2008.2005195",

language = "English",

volume = "17",

pages = "1559--1564",

journal = "IEEE Transactions on Very Large Scale Integration (VLSI) Systems",

issn = "1063-8210",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "10",

}

TY - JOUR

T1 - Identification of Dominant Noise Source and Parameter Sensitivity for Substrate Coupling

AU - Salman, Emre

AU - Friedman, Eby G.

AU - Secareanu, Radu M.

AU - Hartin, Olin L.

PY - 2009/10

Y1 - 2009/10

N2 - A simple, yet physically intuitive macrolevel model is presented to identify the dominant substrate coupling mechanism at the early stages of the design process, while simultaneously considering multiple parameters. Furthermore, the sensitivity of substrate noise to these parameters is evaluated, demonstrating the nonmonotonic dependence of noise on rise time. The design implications of the proposed analysis are discussed, identifying the preferred noise reduction technique for a specific set of operating points.

AB - A simple, yet physically intuitive macrolevel model is presented to identify the dominant substrate coupling mechanism at the early stages of the design process, while simultaneously considering multiple parameters. Furthermore, the sensitivity of substrate noise to these parameters is evaluated, demonstrating the nonmonotonic dependence of noise on rise time. The design implications of the proposed analysis are discussed, identifying the preferred noise reduction technique for a specific set of operating points.

KW - Dominant substrate noise source

KW - Mixed-signal circuits

KW - Substrate noise coupling

UR - https://www.scopus.com/pages/publications/70349733194

U2 - 10.1109/TVLSI.2008.2005195

DO - 10.1109/TVLSI.2008.2005195

M3 - Article

SN - 1063-8210

VL - 17

SP - 1559

EP - 1564

JO - IEEE Transactions on Very Large Scale Integration (VLSI) Systems

JF - IEEE Transactions on Very Large Scale Integration (VLSI) Systems

IS - 10

M1 - 4799227

ER -

Identification of Dominant Noise Source and Parameter Sensitivity for Substrate Coupling

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Keywords

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