Impact of collector-base junction traps and high injection barrier effect on 1/f noise

Jin Tang; Guofu Niu; Alvin J. Joseph; David L. Harame

Impact of collector-base junction traps and high injection barrier effect on 1/f noise

Jin Tang
, Guofu Niu
, Alvin J. Joseph
, David L. Harame

NY Creates Research Foundation

NY Creates

Research output: Contribution to conference › Paper › peer-review

3 Scopus citations

Abstract

This work investigates the impact of CB junction traps and high injection barrier effect on 1/f noise in SiGe HBTs. By comparing the 1/f noise of standard and high breakdown voltage HBTs, we show that the collector-base junction traps result in not only a higher I_B, but also higher base current 1/f noise at high injection. The base current 1/f noise level remains proportional to I_B².

Original language	English
Pages	175-178
Number of pages	4
State	Published - 2003
Event	Proceedings of the 2003 BIPOLAR/BICMOS Circuits and Technology Meeting - Toulouse, France Duration: Sep 28 2003 → Sep 30 2003

Conference

Conference	Proceedings of the 2003 BIPOLAR/BICMOS Circuits and Technology Meeting
Country/Territory	France
City	Toulouse
Period	09/28/03 → 09/30/03

Cite this

@conference{f121244843394da1ab6abe666823204c,

title = "Impact of collector-base junction traps and high injection barrier effect on 1/f noise",

abstract = "This work investigates the impact of CB junction traps and high injection barrier effect on 1/f noise in SiGe HBTs. By comparing the 1/f noise of standard and high breakdown voltage HBTs, we show that the collector-base junction traps result in not only a higher IB, but also higher base current 1/f noise at high injection. The base current 1/f noise level remains proportional to IB2.",

author = "Jin Tang and Guofu Niu and Joseph, \{Alvin J.\} and Harame, \{David L.\}",

year = "2003",

language = "English",

pages = "175--178",

note = "Proceedings of the 2003 BIPOLAR/BICMOS Circuits and Technology Meeting ; Conference date: 28-09-2003 Through 30-09-2003",

}

TY - CONF

T1 - Impact of collector-base junction traps and high injection barrier effect on 1/f noise

AU - Tang, Jin

AU - Niu, Guofu

AU - Joseph, Alvin J.

AU - Harame, David L.

PY - 2003

Y1 - 2003

N2 - This work investigates the impact of CB junction traps and high injection barrier effect on 1/f noise in SiGe HBTs. By comparing the 1/f noise of standard and high breakdown voltage HBTs, we show that the collector-base junction traps result in not only a higher IB, but also higher base current 1/f noise at high injection. The base current 1/f noise level remains proportional to IB2.

AB - This work investigates the impact of CB junction traps and high injection barrier effect on 1/f noise in SiGe HBTs. By comparing the 1/f noise of standard and high breakdown voltage HBTs, we show that the collector-base junction traps result in not only a higher IB, but also higher base current 1/f noise at high injection. The base current 1/f noise level remains proportional to IB2.

UR - https://www.scopus.com/pages/publications/1042277547

M3 - Paper

SP - 175

EP - 178

T2 - Proceedings of the 2003 BIPOLAR/BICMOS Circuits and Technology Meeting

Y2 - 28 September 2003 through 30 September 2003

ER -

Impact of collector-base junction traps and high injection barrier effect on 1/f noise

Abstract

Conference

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