In-situ TEM Probing of Laser-Induced Crystallization of Amorphous Si

B. Xiang; David J. Hwang; Oscar Dubon; Andrew M. Minor; P. Grigoropoulos

doi:10.1017/S1431927612004849

In-situ TEM Probing of Laser-Induced Crystallization of Amorphous Si

B. Xiang
, David J. Hwang
, Oscar Dubon
, Andrew M. Minor
, P. Grigoropoulos

Mechanical Engineering

Stony Brook University

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	598-599
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
Issue number	S2
DOIs	https://doi.org/10.1017/S1431927612004849
State	Published - Jul 1 2012

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title = "In-situ TEM Probing of Laser-Induced Crystallization of Amorphous Si",

author = "B. Xiang and Hwang, \{David J.\} and Oscar Dubon and Minor, \{Andrew M.\} and P. Grigoropoulos",

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AU - Xiang, B.

AU - Hwang, David J.

AU - Dubon, Oscar

AU - Minor, Andrew M.

AU - Grigoropoulos, P.

PY - 2012/7/1

Y1 - 2012/7/1

UR - https://www.scopus.com/pages/publications/85007967001

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DO - 10.1017/S1431927612004849

M3 - Article

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S2

ER -

In-situ TEM Probing of Laser-Induced Crystallization of Amorphous Si

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