TY - GEN
T1 - Influence of Nickel and Bismuth Addition on the Mechanical Shear Strength of SAC+ Ni, Bi Solders under Isothermal Aging and Multiple Reflows
AU - Bandayagari, Jyothsna
AU - Kudtarkar, Santosh
AU - Raj, Arun
AU - Saiyed, Shafi
AU - Patel, Darshil
AU - Zhou, Yingge
N1 - Publisher Copyright: © 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - The transition from tin-lead to lead-free solders, prompted by increasing environmental and health concerns, led to the consideration of the SAC (Tin-Sn, Silver-Ag, and Copper-Cu) solder alloys for various interconnects in electronic packaging. SAC alloys are a popular choice due to their low environmental impact, reliable mechanical properties, excellent solderability, compliance with various regulations like the Restriction of Hazardous Substances (RoHS), and relatively low melting points suitable for electronic manufacturing. However, when used in high-temperature environments, SAC alloys have been experiencing significant degradation and the solder joint's reliability decreases with time because of microstructural changes. Adding alloying elements to SAC, at different percentage weights, bring unique properties to the solder joint reliability. Nickel and Bismuth when added to SAC improve mechanical strength and aging resistance. The objective of this study is to evaluate the solder joint reliability for the SAC+Ni+Bi (SAC-3%Bi, 0.05%Ni) solder alloy by performing the solder ball shear test on the test vehicle. Ball Shear strength of solder joints that went under isothermal aging and multiple reflows were evaluated for the test vehicle whose size is 12 x 9 mm. It was observed that the shear strength of SAC+Ni+Bi outperformed SAC305 by 30% under isothermal aging conditions and 25% under multiple reflows. In addition to this, IMC growth rate was slow for SAC+Ni+Bi in comparison to SAC305. This study finally concludes that SAC+Ni+Bi outperformed SAC305 for both isothermal aging and multiple reflow test conditions. Hence, SAC+Ni+Bi solder alloys could be employed for high reliability applications.
AB - The transition from tin-lead to lead-free solders, prompted by increasing environmental and health concerns, led to the consideration of the SAC (Tin-Sn, Silver-Ag, and Copper-Cu) solder alloys for various interconnects in electronic packaging. SAC alloys are a popular choice due to their low environmental impact, reliable mechanical properties, excellent solderability, compliance with various regulations like the Restriction of Hazardous Substances (RoHS), and relatively low melting points suitable for electronic manufacturing. However, when used in high-temperature environments, SAC alloys have been experiencing significant degradation and the solder joint's reliability decreases with time because of microstructural changes. Adding alloying elements to SAC, at different percentage weights, bring unique properties to the solder joint reliability. Nickel and Bismuth when added to SAC improve mechanical strength and aging resistance. The objective of this study is to evaluate the solder joint reliability for the SAC+Ni+Bi (SAC-3%Bi, 0.05%Ni) solder alloy by performing the solder ball shear test on the test vehicle. Ball Shear strength of solder joints that went under isothermal aging and multiple reflows were evaluated for the test vehicle whose size is 12 x 9 mm. It was observed that the shear strength of SAC+Ni+Bi outperformed SAC305 by 30% under isothermal aging conditions and 25% under multiple reflows. In addition to this, IMC growth rate was slow for SAC+Ni+Bi in comparison to SAC305. This study finally concludes that SAC+Ni+Bi outperformed SAC305 for both isothermal aging and multiple reflow test conditions. Hence, SAC+Ni+Bi solder alloys could be employed for high reliability applications.
KW - Aging
KW - High Temperature Applications
KW - IMC Thickness
KW - Lead-free Solders
KW - Multiple Reflows
KW - Reliability
KW - SAC Alloys
KW - Shear Strength
KW - Surface Morphology
UR - https://www.scopus.com/pages/publications/85197672650
U2 - 10.1109/ECTC51529.2024.00386
DO - 10.1109/ECTC51529.2024.00386
M3 - Conference contribution
T3 - Proceedings - Electronic Components and Technology Conference
SP - 2272
EP - 2279
BT - Proceedings - IEEE 74th Electronic Components and Technology Conference, ECTC 2024
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 74th IEEE Electronic Components and Technology Conference, ECTC 2024
Y2 - 28 May 2024 through 31 May 2024
ER -