Skip to main navigation Skip to search Skip to main content

Influence of tilted geometries on critical current in superconducting thin films

  • B. Maiorov
  • , B. J. Gibbons
  • , S. Kreiskott
  • , V. Matias
  • , Q. X. Jia
  • , T. G. Holesinger
  • , L. Civale

Research output: Contribution to journalArticlepeer-review

29 Scopus citations

Abstract

We present measurements of the angular dependent critical current (J c) of DyBa2Cu3O7 on single crystal SrTiO3 and YBa2Cu3O7 on tilted Ion Beam Assisted Deposition MgO substrate. These experiments demonstrate that Jc angular dependences of tilted defects are a useful tool to detect misalignments between the internal and applied magnetic fields. The results show that, in order to understand vortex pinning in thin anisotropic samples below certain value of magnetic field, this misalignment must be taken into account.

Original languageEnglish
Pages (from-to)2582-2585
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume15
Issue number2 PART III
DOIs
StatePublished - Jun 2005

Keywords

  • Critical current
  • Rare earth compounds
  • Superconducting films
  • Superconducting tapes

Fingerprint

Dive into the research topics of 'Influence of tilted geometries on critical current in superconducting thin films'. Together they form a unique fingerprint.

Cite this