Abstract
A quantitative study of the structure and correlation of individual layer interfaces in a liquid-crystalline polymer multilayer film is reported. Off-specular and specular X-ray scattering data on successively deposited Langmuir-Blodgett films of the polymer show that the roughness of the first and subsequently deposited smectic layers is directly correlated with that of the chemisorbed hydrophobization layer and not correlated with the underlying silicon substrate.
| Original language | English |
|---|---|
| Pages (from-to) | 419-424 |
| Number of pages | 6 |
| Journal | EPL |
| Volume | 32 |
| Issue number | 5 |
| DOIs | |
| State | Published - Nov 10 1995 |
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